Jean L. Schlosser
Electron Microscopy Manager

Jean Schlosser is highly regarded as a leader in SEM/EDS (scanning electron microscopy/energy dispersive x-ray spectrometry) technology. Her analytical background includes all areas of material failures, fractures, corrosion, wear and deformation.

Jean has more than 20 years of experience interpreting SEM/EDS data and can quickly recommend appropriate analytical protocol – which means cost-effective results for clients. The results of Jean's work are often crucial to client product liability cases and insurance claims.

She oversees every aspect of the SEM/EDS service, including micrographs, qualitative/quantitative chemical analysis, x-ray mapping, line scans, color digital imaging, compact disk and videotape documentation.

Jean stays on top of the latest microscopy innovations through the programs and activities of the Microscopy Society of America, the Microbeam Analysis Society, ASM International, the International Microelectronics & Packaging Society and Medical Alley.

Email: info@CraneEngineering.com
Download complete Jean Schlosser profile (.pdf)